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Volumn 33, Issue 4, 2004, Pages 290-299

Thermosonic Bonding of Gold Wire onto a Copper Pad with Titanium Thin-Film Deposition

Author keywords

Bondability; Chips with copper interconnect; Thermosonic wire bonding; Ti thin film

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHEMICAL ANALYSIS; COPPER; COPPER OXIDES; DEPOSITION; GOLD; HIGH TEMPERATURE EFFECTS; INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; OXIDATION; THIN FILMS; TITANIUM; WIRE;

EID: 2342489452     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-004-0135-5     Document Type: Article
Times cited : (25)

References (20)
  • 11
    • 2342549012 scopus 로고    scopus 로고
    • EIA/JEDEC STANDARD (Arlington, VA: Electronic Industries Alliance)
    • EIA/JESD22-B116, Wire Bond Shear Test, EIA/JEDEC STANDARD (Arlington, VA: Electronic Industries Alliance, 1998).
    • (1998) EIA/JESD22-B116, Wire Bond Shear Test


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.