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An overview of low noise devices and associated circuits for 100-200 GHz space applications
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th GAAS Symposium 2003, p. 473 - 476.
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th GAAS Symposium 2003
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Dambrine, G.1
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3
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0037278351
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Reliability and degradation mechanism of AlGaAs/InGaAs and InAlAs/InGaAs HEMTs
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M. Dammann, A. Leuther, F. Benkhelifa, T. Feltgen, W. Jantz, "Reliability and degradation mechanism of AlGaAs/InGaAs and InAlAs/InGaAs HEMTs", Phys. Stat. Sol. (a) Vol. 195, No. 1, 2003, p. 81 - 86.
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4
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0036053493
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High reliability of 0.07 μm pseudomorphic InGaAs/lnAlAs/InP HEMT MMICs on 3-Inch InP substrates
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th Indium Phosphide and Related Materials Conference 2002, p. 365 - 368.
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th Indium Phosphide and Related Materials Conference 2002
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Chou, Y.C.1
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5
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0038149436
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70 nm low-noise metamorphic HEMT technology on 4 Inch GaAs wafers
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A. Leuther, A. Tessmann, M. Dammann, W. Reinert, M. Schlechtweg, M. Mikulla, M. Walther, G. Weimann, "70 nm low-noise metamorphic HEMT technology on 4 Inch GaAs wafers", Indium Phosphide and Related Materials Conference 2003, p. 215 - 218.
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Indium Phosphide and Related Materials Conference 2003
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Leuther, A.1
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Schlechtweg, M.5
Mikulla, M.6
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Weimann, G.8
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6
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0033221295
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Very high gain millimeter-wave InAlAs/InGaAs/GaAs metamorphic HEMTs
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K. C. Hwang, P. C. Chao, C. Creamer, K. B. Nichols, S. Wang, D. Tu, W. Kong, D. Dugas, G. Patton, "Very high gain millimeter-wave InAlAs/InGaAs/GaAs metamorphic HEMTs" IEEE Election. Device Lett., Vol. 20, No.11, 1999, p. 551-553.
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Kong, W.7
Dugas, D.8
Patton, G.9
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8
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0037019241
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66 GHz 2:1 static frequency divider using 100 nm metamorphic enhancement HEMT technology
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M. Lang, A. Leuther, W. Benz, U. Nowotny, O. Kappeler, M. Schlechtweg, "66 GHz 2:1 static frequency divider using 100 nm metamorphic enhancement HEMT technology", Electron. Lett., Vol. 38, No. 14, 2002, p. 716-717.
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9
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0038046539
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108 GHz dynamic frequency divider in 100 nm metamorphic enhancement HEMT technology
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O. Kappeler, A. Leuther, W. Benz and M. Schlechtweg, "108 GHz dynamic frequency divider in 100 nm metamorphic enhancement HEMT technology", Electron. Lett., Vol. 39, No. 13, 2003, p. 989 - 990.
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