Fabrication and characterization of advanced probes for magnetic force microscopy

Applied Surface Science

Volumn 144-145, Issue , 1999, Pages 492-496

  Leinenbach, P ^a,b   Memmert, U ^a,b   Schelten, J ^b   Hartmann, U ^a,b  

^a SAARLAND UNIVERSITY   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Magnetic force microscopy

Indexed keywords

ARGON; COBALT COMPOUNDS; ELECTRON BEAM LITHOGRAPHY; ETCHING; FABRICATION; IMAGING TECHNIQUES; IRON; MAGNETIC FIELD EFFECTS; NICKEL; PARTICLES (PARTICULATE MATTER); PERMANENT MAGNETS; POSITIVE IONS;

MAGNETIC FORCE MICROSCOPY; NONDESTRUCTIVE IMAGING; SCANNING PROBE MICROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 0032679077     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00853-8     Document Type: Article

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