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Review of Scientific Instruments

Volumn 65, Issue 10, 1994, Pages 3224-3228

Magnetic force microscopy using electron-beam fabricated tips

(3) Ruhrig M a Porthun, S a Lodder, J C a

a UNIVERSITY OF TWENTE (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CARBON; DATA RECORDING; ELECTRON BEAMS; ELECTRON MICROSCOPES; FABRICATION; FERROMAGNETIC MATERIALS; MAGNETIZATION; MAGNETOOPTICAL EFFECTS; SUPERLATTICES; THIN FILMS;

CANTILEVERS; CARBON NEEDLE; ELECTRON BEAM INDUCED DEPOSITION; MAGNETIC FORCE MICROSCOPY; SOFT MAGNETIC MATERIALS; TIP PREPARATION;

MICROSCOPIC EXAMINATION;

EID: 0028526815 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.1144554 Document Type: Article

Times cited : (44)

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