Quantifying surface topography and scanning probe image reconstruction

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 17, Issue 2, 1999, Pages 273-279

  Kitching, S ^a   Williams, P M ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22644452598     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590550     Document Type: Article

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