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Volumn , Issue , 2004, Pages 322-325

Z-pinch discharge based EUV radiation source driven by a low inductance gap-less circuit

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC GENERATORS; GAS DISCHARGE TUBES; INDUCTANCE; INERT GASES; LIGHT SOURCES; NETWORKS (CIRCUITS); PLASMA DEVICES; SPECTRUM ANALYSIS;

EID: 22244458940     PISSN: 10768467     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (6)
  • 1
  • 2
    • 0034376419 scopus 로고    scopus 로고
    • Xenon-emission spectra identification in the 5-20 nm spectral region in highly ionized xenon capillary-discharge plasmas
    • W.T. Silfvast, M.A. Klosner, "Xenon-emission spectra identification in the 5-20 nm spectral region in highly ionized xenon capillary-discharge plasmas," J. Opt. Soc. Am. B: Optical Physics, 17(7), 1279-1290 (2000)
    • (2000) J. Opt. Soc. Am. B: Optical Physics , vol.17 , Issue.7 , pp. 1279-1290
    • Silfvast, W.T.1    Klosner, M.A.2
  • 3
    • 85010119652 scopus 로고    scopus 로고
    • High-power extreme ultraviolet source based on a z-pinch
    • M. McGeoch, "High-power extreme ultraviolet source based on a z-pinch," Appl. Optics 37, 1651-1658 (1998)
    • (1998) Appl. Optics , vol.37 , pp. 1651-1658
    • McGeoch, M.1
  • 4
    • 0033684545 scopus 로고    scopus 로고
    • Development of an EUV (13.5 nm) light source employing a dense plasma focus in lithium vapor
    • W.N. Partlo, I.V. Fomenkov, R. Oliver, D.L. Birx, "Development of an EUV (13.5 nm) light source employing a dense plasma focus in lithium vapor," Proc. SPIE 3997, 136-156 (2000)
    • (2000) Proc. SPIE , vol.3997 , pp. 136-156
    • Partlo, W.N.1    Fomenkov, I.V.2    Oliver, R.3    Birx, D.L.4
  • 5
    • 0032614398 scopus 로고    scopus 로고
    • Highly repetitive extreme ultraviolet radiation source based on a gas-discharge plasma
    • K. Bergman, G. Schriever, O. Rosier, M. Mueller, W. Neff, R. Lebert, "Highly repetitive extreme ultraviolet radiation source based on a gas-discharge plasma, Appl. Opt., 38, 5413-5417 (1999)
    • (1999) Appl. Opt. , vol.38 , pp. 5413-5417
    • Bergman, K.1    Schriever, G.2    Rosier, O.3    Mueller, M.4    Neff, W.5    Lebert, R.6
  • 6
    • 0942268376 scopus 로고    scopus 로고
    • Extreme ultraviolet emission spectra of highly ionized xenon and their comparison of model calculations
    • N. Bowering, M. Martins, W.N. Partlo, I.V. Fomenkov, "Extreme ultraviolet emission spectra of highly ionized xenon and their comparison of model calculations," J. Appl. Phys., 95(1), 16-23 (2004)
    • (2004) J. Appl. Phys. , vol.95 , Issue.1 , pp. 16-23
    • Bowering, N.1    Martins, M.2    Partlo, W.N.3    Fomenkov, I.V.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.