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Volumn 18, Issue 4, 2005, Pages 283-296

Non-linear performance comparison for FD and PD SOI MOSFETs based on the integral function method and Volterra modelling

Author keywords

Distortion; FD; Fully depleted; IFM; Integral function method; Intermodulation; Linearity; Partially depleted; PD; Silicon oninsulator; SOI; Volterra

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC POTENTIAL; INTERMODULATION; MATHEMATICAL MODELS; POWER AMPLIFIERS; SILICON ON INSULATOR TECHNOLOGY; WIRELESS TELECOMMUNICATION SYSTEMS;

EID: 22144449577     PISSN: 08943370     EISSN: None     Source Type: Journal    
DOI: 10.1002/jnm.578     Document Type: Article
Times cited : (8)

References (19)
  • 9
    • 4544340565 scopus 로고    scopus 로고
    • Integral function method for determination of nonlinear harmonic distortion
    • Cerdeira A, Alemán M. Estrada M, Flandre D. Integral function method for determination of nonlinear harmonic distortion. Solid-State Electronics 2004; 48(12):2225-2234.
    • (2004) Solid-state Electronics , vol.48 , Issue.12 , pp. 2225-2234
    • Cerdeira, A.1    Alemán, M.2    Estrada, M.3    Flandre, D.4
  • 10
    • 0029210706 scopus 로고    scopus 로고
    • Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device
    • Orlando, Florida
    • Verspecht J, Debie P, Barel A, Martens L. Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device. IEEE International Microwave Symposium Digest 1995, Orlando, Florida; 1029-1032.
    • IEEE International Microwave Symposium Digest 1995 , pp. 1029-1032
    • Verspecht, J.1    Debie, P.2    Barel, A.3    Martens, L.4
  • 13
    • 21644432420 scopus 로고    scopus 로고
    • Mathematical basis of the expressions used by the integral function method for the determination of nonlinear harmonic distortion in devices and circuits
    • Bejing, China
    • Cerdeira A, Estrada M. Mathematical basis of the expressions used by the integral function method for the determination of nonlinear harmonic distortion in devices and circuits. Proceedings of ICSICT 2004, Bejing, China, 2004.
    • (2004) Proceedings of ICSICT 2004
    • Cerdeira, A.1    Estrada, M.2
  • 18
    • 0026904737 scopus 로고
    • A small-signal model for the frequency-dependent drain admittance in floating-substrate MOSFET's
    • Howes R, Redman-White W. A small-signal model for the frequency-dependent drain admittance in floating-substrate MOSFET's. IEEE Journal of Solid-State Circuits 1992; 27(8): 1186-1193.
    • (1992) IEEE Journal of Solid-state Circuits , vol.27 , Issue.8 , pp. 1186-1193
    • Howes, R.1    Redman-White, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.