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Volumn 3, Issue , 1995, Pages 1029-1032
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Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device
a
a
and Description Group
*
(Belgium)
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Author keywords
[No Author keywords available]
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Indexed keywords
CALIBRATION;
ELECTROMAGNETIC WAVE SCATTERING;
MATHEMATICAL MODELS;
MESFET DEVICES;
OSCILLOGRAPHS;
PHASE MEASUREMENT;
SIGNAL DISTORTION;
WAVEGUIDE ATTENUATORS;
WAVEGUIDE COUPLERS;
ON WAFER MEASUREMENT;
ROOT MODEL;
VOLTAGE WAVES;
MICROWAVE DEVICES;
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EID: 0029210706
PISSN: 0149645X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (133)
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References (11)
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