Surface charging under pulsed laser ablation of solids and its consequences: Studies with a continuum approach

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5714, Issue , 2005, Pages 9-23

  Bulgakova, N M ^a   Stoian, R ^b,c   Rosenfeld, A ^b   Hertel, I V ^b   Campbell, E E B ^d  

^a KUTATELADZE INSTITUTE OF THERMOPHYSICS   (Russian Federation)

^b MAX BORN INSTITUT   (Germany)

^c UNIVERSITÉ JEAN MONNET   (France)

^d UNIVERSITY OF GOTHENBURG   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; DIELECTRIC DEVICES; ELECTRIC EXCITATION; FREE ELECTRON LASERS; LASER ABLATION; LASER BEAM EFFECTS; LIGHT ABSORPTION; LIGHT REFLECTION; PARAMETER ESTIMATION;

CHARGE-CARRIER TRANSPORT; COULOMB EXPLOSION; PULSED LASER ABLATION; SURFACE CHARGING;

PULSED LASER APPLICATIONS;

EID: 22044453207     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.594047     Document Type: Conference Paper

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