Non-thermal melting in semiconductors measured at femtosecond resolution

Nature

Volumn 410, Issue 6824, 2001, Pages 65-67

  Rousse, A ^a   Rischel, C ^b,c   Fourmaux, S ^a   Uschmann, I ^d   Sebban, S ^a   Grillon, G ^a   Balcou, Ph ^a   Forster E ^d   Geindre, J P ^e   Audebert, P ^e   Gauthier, J C ^e   Hulin, D ^a  

^a LABORATOIRE D OPTIQUE APPLIQUÉE   (France)

^b UNIVERSITY OF COPENHAGEN   (Denmark)

^c UNIVERSITY OF COPENHAGEN   (Denmark)

^d FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^e ECOLE POLYTECHNIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; KINETICS; MEASUREMENT; MELTING POINT; PRIORITY JOURNAL; SEMICONDUCTOR; X RAY DIFFRACTION;

EID: 0035282606     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/35065045     Document Type: Article

References (28)

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