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Volumn 1, Issue , 2004, Pages 619-623
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Intrinsic performance of carbon-nanotube transistors
a
NEC CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
ELECTRON BEAM LITHOGRAPHY;
ELECTRONIC PROPERTIES;
FIELD EFFECT TRANSISTORS;
LASER ABLATION;
MOSFET DEVICES;
OHMIC CONTACTS;
SECOND HARMONIC GENERATION;
TRANSCONDUCTANCE;
TRANSMISSION ELECTRON MICROSCOPY;
DRAIN VOLTAGES;
ELECTRICAL TUBE FURNACES;
INTRINSIC TRANSCONDUCTANCE;
PARASITIC RESISTANCES;
CARBON NANOTUBES;
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EID: 21644453346
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (15)
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