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Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2002-January, Issue , 2002, Pages 120-125

Automatic test program generation from RT-level microprocessor descriptions

(4) Corno, F a Cumani, G a Sonza Reorda, M a Squillero, G a

Author keywords

Automatic test pattern generation; Automatic testing; Design for testability; Inspection; Libraries; Microcontrollers; Microprocessors; Monitoring; Performance evaluation; Prototypes

Indexed keywords

ALGORITHMS; AUTOMATIC PROGRAMMING; AUTOMATIC TESTING; DESIGN FOR TESTABILITY; INSPECTION; LIBRARIES; MICROCONTROLLERS; MICROPROCESSOR CHIPS; MONITORING; OPTIMIZATION; SOFTWARE TESTING; TEST FACILITIES;

AUTOMATIC TEST PROGRAM GENERATIONS; COMPUTATIONAL EFFORT; FAULT COVERAGES; INSTRUCTION SET; OPTIMIZATION ALGORITHMS; PERFORMANCE EVALUATION; PROTOTYPES; PROTOTYPICAL IMPLEMENTATION;

AUTOMATIC TEST PATTERN GENERATION;

EID: 21444454039 PISSN: 19483287 EISSN: 19483295 Source Type: Conference Proceeding
DOI: 10.1109/ISQED.2002.996710 Document Type: Conference Paper

Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.