Shear-force detection based on an external cavity laser interferometer for a compact scanning near field optical microscope

Review of Scientific Instruments

Volumn 68, Issue 12, 1997, Pages 4478-4482

  Pfeffer, M ^a   Lambelet, P ^a   Marquis Weible, F ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; MECHANICAL PROPERTIES; MICROSCOPES; OPTICAL DESIGN; SEMICONDUCTOR DIODES; THERMODYNAMIC PROPERTIES;

EXTERNAL CAVITY LASER INTERFEROMETER; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SHEAR FORCE DETECTION;

OPTICAL MICROSCOPY;

EID: 0031373876     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148450     Document Type: Article

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