Surface passivation and electronic structure characterization of PbTiO 3 thin films and PtPbTiO 3 interfaces

Journal of Applied Physics

Volumn 97, Issue 10, 2005, Pages

  Kurasawa, Masaki ^a,b   McLntyre, Paul C ^a  

^a Stanford University   (United States)

^b FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FERMI ENERGY PINNING; FERROELECTRIC RANDOM ACCESS MEMORY (FERAM); ROOM TEMPERATURE; SCHOTTKY BARRIERS;

BINDING ENERGY; CAPACITORS; ELECTRONIC STRUCTURE; EPITAXIAL GROWTH; FERMI LEVEL; INTERFACES (MATERIALS); METALLORGANIC CHEMICAL VAPOR DEPOSITION; PASSIVATION; SURFACE STRUCTURE; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

LEAD COMPOUNDS;

EID: 20944439624     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1897073     Document Type: Article

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