A comparative study of CuInSe2 and CuIn3Se 5 films using transmission electron microscopy, optical absorption and Rutherford backscattering spectrometry

Solar Energy Materials and Solar Cells

Volumn 88, Issue 3, 2005, Pages 281-292

  Malar, P ^a   Kasiviswanathan, S ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

CuIn3Se5; CuInSe2; RBS; TEM; Thin films

Indexed keywords

DIFFUSION; ELECTRIC FIELDS; EVAPORATION; GRAIN SIZE AND SHAPE; GROWTH KINETICS; LIGHT ABSORPTION; LIGHT POLARIZATION; POLYCRYSTALLINE MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STOICHIOMETRY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CUIN3SE5; CUINSE2; FLASH EVAPORATION; RBS;

COPPER COMPOUNDS;

EID: 20844463562     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2004.11.002     Document Type: Article

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