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Volumn 85, Issue 4, 2005, Pages 521-533

Characterization of stepwise flash evaporated CuIn3Se 5 films

Author keywords

Ordered defect compounds; RBS; TEM; XRD

Indexed keywords

COPPER COMPOUNDS; CRYSTAL STRUCTURE; EVAPORATION; OPACITY; POLYCRYSTALLINE MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 10444242711     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2004.05.013     Document Type: Article
Times cited : (19)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.