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Volumn 28-30, Issue PART 2, 1988, Pages 1111-1115

Chemical diffusion coefficients and stability of CuInS2 and CuInSe2 from polarization measurements with point electrodes

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS--CURRENT; IONS--DIFFUSION; SEMICONDUCTOR MATERIALS--ELECTRIC CONDUCTIVITY;

EID: 0024068272     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/0167-2738(88)90340-2     Document Type: Article
Times cited : (36)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.