Electronic properties of a semiconducting oligomer/silicon (111) interface: Influence of silicon doping

Applied Physics Letters

Volumn 86, Issue 22, 2005, Pages 1-3

  Papaefthimiou, V ^a   Kennou, S ^a  

^a UNIVERSITY OF PATRAS   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; DOPING (ADDITIVES); SEMICONDUCTING ORGANIC COMPOUNDS; SILICON; THIN FILMS; ULTRAHIGH VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

OLIGOMER FILM GROWTH; OLIGOMER POWDERS; SEMICONDUCTING OLIGOMERS; SILICON DOPING;

OLIGOMERS;

EID: 20844460253     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1929073     Document Type: Article

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