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Volumn 566-568, Issue 1-3 PART 1, 2004, Pages 497-501
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The electronic structure of the sputtered indium-tin oxide and a thin conjugated oligomer film interface
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Author keywords
Growth; Heterojunctions; Indium; Interface states; Photoelectron spectroscopy; Surface electronic phenomena (work function, surface potential, surface states, etc.; Tin Oxides
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Indexed keywords
ELECTRONIC STRUCTURE;
FIELD EFFECT TRANSISTORS;
FILM GROWTH;
HETEROJUNCTIONS;
INTERFACES (MATERIALS);
LIGHT EMITTING DIODES;
OLIGOMERS;
SPUTTERING;
THIN FILMS;
TIN COMPOUNDS;
ULTRAHIGH VACUUM;
X RAY PHOTOELECTRON SPECTROSCOPY;
INTERFACE STATES;
SURFACE ELECTRONIC PHENOMENA (WORK FUNCTION, SURFACE POTENTIAL ETC.);
TIN OXIDES;
ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY (UPS);
INDIUM COMPOUNDS;
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EID: 4544388058
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2004.05.102 Document Type: Conference Paper |
Times cited : (20)
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References (20)
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