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Volumn 377, Issue 2-3, 1996, Pages 177-564

Proceedings of the 1995 7th European Symposium on Semiconductor Detectors
[No Author Info available]

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CHARGE COUPLED DEVICES; DEEP LEVEL TRANSIENT SPECTROSCOPY; GAMMA RAYS; MICROSTRIP DEVICES; NUCLEAR PHYSICS; RADIATION DAMAGE; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; SILICON SENSORS; X RAY SPECTROSCOPY;

EID: 0030214005     PISSN: 01689002     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/0168-9002(96)00205-7     Document Type: Conference Review
Times cited : (25)

References (27)
  • 17
    • 85114549654 scopus 로고
    • R.E. Stahlbush A.H. Edwards C.R. Helms B.E. Deal The Physics and Chemisty of SiO, and the Si-SiO, Interface 2 1993 Plenum New York 489
    • (1993) , pp. 489
    • Stahlbush, R.E.1    Edwards, A.H.2
  • 27
    • 0041540304 scopus 로고
    • Photoelektrische Untersuchungen am Si/SiO2, System
    • 2, System 1990 Habilitationsschrift New York
    • (1990)
    • Schmidt, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.