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Volumn 377, Issue 2-3, 1996, Pages 177-564
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Proceedings of the 1995 7th European Symposium on Semiconductor Detectors
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
CHARGE COUPLED DEVICES;
DEEP LEVEL TRANSIENT SPECTROSCOPY;
GAMMA RAYS;
MICROSTRIP DEVICES;
NUCLEAR PHYSICS;
RADIATION DAMAGE;
SEMICONDUCTOR DEVICES;
SEMICONDUCTOR MATERIALS;
SILICON SENSORS;
X RAY SPECTROSCOPY;
CHARGE CARRIER RECOMBINATION;
EIREV;
GAMMA RAY DETECTORS;
GAS IMMERSION LASER DOPING;
RADIATION HARDNESS;
SILICON DRIFT DETECTORS;
SILICON STRIP DETECTORS;
X RAY DETECTORS;
RADIATION DETECTORS;
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EID: 0030214005
PISSN: 01689002
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1016/0168-9002(96)00205-7 Document Type: Conference Review |
Times cited : (25)
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References (27)
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