Growth, structure, and stability of ceria films on Si(111) and the application of CaF2 buffer layers

Journal of Physical Chemistry B

Volumn 109, Issue 21, 2005, Pages 10978-10985

  Zarraga Colina, Jeannette ^a   Nix, Roger M ^a   Weiss, Helmut ^b  

^a QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

^b OTTO VON GUERICKE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CALCIUM COMPOUNDS; CERIUM COMPOUNDS; DIELECTRIC MATERIALS; EVAPORATION; LOW ENERGY ELECTRON DIFFRACTION; STAINLESS STEEL; THERMODYNAMIC STABILITY; THIN FILMS; ULTRAHIGH VACUUM;

BUFFER LAYERS; CERIA FILMS; GROWTH STRUCTURE; SILICON SURFACE;

SILICON;

EID: 20544465166     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0508296     Document Type: Article

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