XPS study of oxidation processes of CeOx defective layers

Applied Surface Science

Volumn 158, Issue 1, 2000, Pages 164-171

  Holgado, J P ^a   Munuera, G ^a   Espinos J P ^a   Gonzalez Elipe A R ^a  

^a CSIC JA USE Centro de Investigaciones Cientificas Isla de la Cartuja CICIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CRYSTAL DEFECTS; ION BOMBARDMENT; OXIDATION; STOICHIOMETRY; TEMPERATURE; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CERIUM OXIDE; SURFACE CONTAMINATION;

CERIUM COMPOUNDS;

EID: 0033687205     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00597-8     Document Type: Article

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