Characterization of polymer thin films by phase-sensitive acoustic microscopy and atomic force microscopy: A comparative review

Journal of Microscopy

Volumn 218, Issue 3, 2005, Pages 208-218

  Ngwa, Wilfred ^a   Luo, W ^a   Kamanyi, A ^b   Fomba, K W ^b   Grill, W ^b  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

^b UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

Atomic force microscopy (AFM); Phase sensitive acoustic microscopy (PSAM); Polymer thin films; Thin film structure and physical properties

Indexed keywords

ACOUSTIC MICROSCOPES; ACOUSTIC VARIABLES MEASUREMENT; POLYMER FILMS; SURFACE WAVES; THIN FILMS;

ATOMIC FORCE MICROSCOPY; ATOMIC-FORCE-MICROSCOPY; CONTRAST IMAGING; PHASE-SENSITIVE ACOUSTIC MICROSCOPY; POLYMER THIN FILMS; STRUCTURE AND PHYSICAL PROPERTIES; THIN FILM STRUCTURE AND PHYSICAL PROPERTY; THIN-FILM STRUCTURE; THREE-DIMENSIONAL VECTORS;

ATOMIC FORCE MICROSCOPY;

POLYMER;

ACOUSTIC MICROSCOPY; ATOMIC FORCE MICROSCOPY; FILM; INTERMETHOD COMPARISON; PHASE SENSITIVE ACOUSTIC MICROSCOPY; PRIORITY JOURNAL; QUALITATIVE ANALYSIS; QUANTITATIVE ANALYSIS; REVIEW; SURFACE PROPERTY; TECHNIQUE; TOPOGRAPHY;

EID: 20444482481     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2005.01484.x     Document Type: Review

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