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Volumn 152, Issue 2, 2005, Pages 183-188

All-analytic surface potential model for SOI MOSFETs

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SIMULATION; FULLY DEPLETED (FD); PARTIALLY DEPLETED (PD); SURFACE POTENTIAL;

EID: 20444432336     PISSN: 13502409     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/ip-cds:20041110     Document Type: Conference Paper
Times cited : (22)

References (14)
  • 3
    • 84888628829 scopus 로고    scopus 로고
    • A continuous compact MOSFET model for fully- and partially-depleted SOI devices
    • Sleight, J.W., and Rios, R.: 'A continuous compact MOSFET model for fully- and partially-depleted SOI devices', IEEE Trans. Electron Devices, 1998, 45, pp. 821-825
    • (1998) IEEE Trans. Electron Devices , vol.45 , pp. 821-825
    • Sleight, J.W.1    Rios, R.2
  • 4
    • 0032595361 scopus 로고    scopus 로고
    • A unified analytical fully depleted and partially depleted SOI MOSFET model
    • Jang, S.-L., Huang, B.-R., and Ju, J.-J.: 'A unified analytical fully depleted and partially depleted SOI MOSFET model', IEEE Trans. Electron Devices, 1999, 46, pp. 1872-1876
    • (1999) IEEE Trans. Electron Devices , vol.46 , pp. 1872-1876
    • Jang, S.-L.1    Huang, B.-R.2    Ju, J.-J.3
  • 6
    • 0035114925 scopus 로고    scopus 로고
    • A physically based compact model of partially depleted SOI MOSFETs for analog circuit simulation
    • Lee, M.S.L., Tenbroek, B.M., Redman-White, W., Benson, J., and Uren, M.J.: 'A physically based compact model of partially depleted SOI MOSFETs for analog circuit simulation', IEEE J. Solid-State Circuits, 2001, 36, pp. 110-121
    • (2001) IEEE J. Solid-state Circuits , vol.36 , pp. 110-121
    • Lee, M.S.L.1    Tenbroek, B.M.2    Redman-White, W.3    Benson, J.4    Uren, M.J.5
  • 9
    • 0034159715 scopus 로고    scopus 로고
    • An explicit surface-potential MOSFET model for circuit simulation
    • van Langevelde, R., and Klaassen, F.M.: 'An explicit surface-potential MOSFET model for circuit simulation', Solid-State Electron., 2000, 44, pp. 409-418
    • (2000) Solid-state Electron. , vol.44 , pp. 409-418
    • Van Langevelde, R.1    Klaassen, F.M.2
  • 11
    • 0029307806 scopus 로고
    • An analytical drain current model considering both electron and lattice temperatures simultaneously for deep submicron ultrathin SOI NMOS devices with self-heating
    • Chen, Y.-G., Ma, S.-Y., Kuo, J.B., Yu, Z., and Dutton, R.W.: 'An analytical drain current model considering both electron and lattice temperatures simultaneously for deep submicron ultrathin SOI NMOS devices with self-heating', IEEE Trans. Electron Devices, 1995, 42, pp. 899-906
    • (1995) IEEE Trans. Electron Devices , vol.42 , pp. 899-906
    • Chen, Y.-G.1    Ma, S.-Y.2    Kuo, J.B.3    Yu, Z.4    Dutton, R.W.5
  • 12
    • 0029306016 scopus 로고
    • Modeling the polysilicon depletion effect and its impact on submicrometer CMOS circuit performance
    • Arora, N.D., Rios, R., and Huang, C.L.: 'Modeling the polysilicon depletion effect and its impact on submicrometer CMOS circuit performance', IEEE Trans. Electron Devices, 1995, 42, (5), pp. 935-943
    • (1995) IEEE Trans. Electron Devices , vol.42 , Issue.5 , pp. 935-943
    • Arora, N.D.1    Rios, R.2    Huang, C.L.3
  • 13
    • 0031097098 scopus 로고    scopus 로고
    • An analytical CAD kink effect model of partially-depleted SOI NMOS devices operating in strong inversion
    • Chen, S.S., and Kuo, J.B.: 'An analytical CAD kink effect model of partially-depleted SOI NMOS devices operating in strong inversion', Solid-State Electron., 1997, 41, (3), pp. 447-458
    • (1997) Solid-state Electron. , vol.41 , Issue.3 , pp. 447-458
    • Chen, S.S.1    Kuo, J.B.2
  • 14
    • 0028375272 scopus 로고
    • Modeling the I-V characteristics of fully depleted submicronmeter SOI MOSFET's
    • Hsiao, T.C., Kistler, N.A., and Woo, J.C.S.: 'Modeling the I-V characteristics of fully depleted submicronmeter SOI MOSFET's', IEEE Electron Devices Lett., 1994, 15, (2), pp. 45-47
    • (1994) IEEE Electron Devices Lett. , vol.15 , Issue.2 , pp. 45-47
    • Hsiao, T.C.1    Kistler, N.A.2    Woo, J.C.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.