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Volumn 45, Issue 4, 1998, Pages 821-825

A continuous compact MOSFET model for fully- and partially-depleted SOI devices

Author keywords

[No Author keywords available]

Indexed keywords

COMPACT MOSFET MODELS; DEVICE OPERATIONS; FULLY DEPLETED; PARTIALLY DEPLETED; PARTIALLY-DEPLETED SOI; SOI-MOSFETS;

EID: 84888628829     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.662786     Document Type: Article
Times cited : (61)

References (11)
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  • 2
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    • D. Suh and J. Fossum, "A physical charge-based model for nonfullydepleted SOI MOSFET's and its use in assessing floating-body effects in SOI CMOS circuits," IEEE Trans. Electron Devices, vol. 42, pp. 728-737, Apr. 1995.
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  • 3
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    • A continuous compact MOSFET model for SOI with automatic transitions between fully and partially-depleted device behavior
    • J. W. Sleight and R. Rios, "A continuous compact MOSFET model for SOI with automatic transitions between fully and partially-depleted device behavior," in IEDM Tech. Dig., 1996, pp. 143-146.
    • (1996) IEDM Tech. Dig , pp. 143-146
    • Sleight, J.W.1    Rios, R.2
  • 4
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    • A charge sheet capacitance model of shortchannel MOSFET's for SPICE
    • Mar
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    • (1991) IEEE Trans. Computer-Aided Design , vol.10 , pp. 376-389
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  • 5
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    • Modeling the I-V characteristics of fully-depleted SOI MOSFET's including self-heating
    • Oct
    • N. D. Arora, L. T. Su, B. S. Doyle, and D. Antoniadis, "Modeling the I-V characteristics of fully-depleted SOI MOSFET's including self-heating," in Proc. IEEE SOI Conf., Oct. 1994, pp. 19-20.
    • (1994) Proc IEEE SOI Conf , pp. 19-20
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  • 6
    • 0028446654 scopus 로고
    • PCIM: A physically based continuous short-channel IGFET model for circuit simulation
    • June
    • N. D. Arora, R. Rios, C.-L. Huang, and K. Raol, "PCIM: A physically based continuous short-channel IGFET model for circuit simulation," IEEE Trans. Electron Devices, vol. 41, pp. 988-997, June 1994.
    • (1994) IEEE Trans. Electron Devices , vol.41 , pp. 988-997
    • Arora, N.D.1    Rios, R.2    Huang, C.-L.3    Raol, K.4
  • 7
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    • An analytic polysilicon depletion effect model for MOSFET's
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    • R. Rios, N. D. Arora, and C.-L. Huang, "An analytic polysilicon depletion effect model for MOSFET's," IEEE Electron Device Lett., vol. 15, pp. 129-131, Apr. 1994.
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  • 8
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    • R. Rios, N. D. Arora, C.-L. Huang, N. Khalil, J. Faricelli, and L. Gruber, "A physical compact MOSFET model, including quantum mechanical effects, for statistical circuit design applications," in IEDM Tech. Dig., Dec. 1995, pp. 937-940.
    • (1995) IEDM Tech. Dig , pp. 937-940
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  • 11
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.