Site-specific specimen preparation by focused ion beam milling for transmission electron microscopy of metal matrix composites

Microscopy and Microanalysis

Volumn 10, Issue 2, 2004, Pages 311-316

  Gasser, Philippe ^a   Klotz, Ulrich E ^a   Khalid, Fazal A ^b   Beffort, Olivier ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b GIK INSTITUTE OF ENGINEERING SCIENCES AND TECHNOLOGY   (Pakistan)

Author keywords

Aluminum; Diamond; Focused ion beam (FIB); Interface; Microstructure; Transmission electron microscopy (TEM)

Indexed keywords

METAL; RESIN;

CHEMICAL STRUCTURE; CHEMISTRY; CONFERENCE PAPER; ELECTRON MICROSCOPY; METHODOLOGY; SCANNING ELECTRON MICROSCOPY;

METALS; MICROSCOPY, ELECTRON; MICROSCOPY, ELECTRON, SCANNING; MODELS, MOLECULAR; RESINS, SYNTHETIC;

EID: 2042491278     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604040413     Document Type: Conference Paper

References (10)

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