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Volumn 51, Issue 15, 2003, Pages 4575-4582

Study of microstructure and interfaces in an aluminium-C60 composite material

Author keywords

Aluminium; Fullerenes (C60); Interface; Microstructure; Transmission electron microscopy (TEM)

Indexed keywords

AGGLOMERATION; ALUMINUM ALLOYS; COMPOSITE MATERIALS; CRYSTALLINE MATERIALS; CRYSTALS; INTERFACES (MATERIALS); MICROSTRUCTURE; PREFORMING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0042062430     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(03)00294-5     Document Type: Article
Times cited : (69)

References (24)
  • 11
    • 0042979904 scopus 로고    scopus 로고
    • Site specific specimen preparation by focussed ion beam (FIB) milling for transmission electron microscopy of metal matrix composites
    • accepted for publication
    • Gasser P, Khalid FA, Klotz UE, Beffort O. Site specific specimen preparation by focussed ion beam (FIB) milling for transmission electron microscopy of metal matrix composites. Microscopy and Microanalysis (accepted for publication).
    • Microscopy and Microanalysis
    • Gasser, P.1    Khalid, F.A.2    Klotz, U.E.3    Beffort, O.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.