The study and application of a new filtering method on electronic speckle pattern interferometric fringe

Optics and Lasers in Engineering

Volumn 39, Issue 4, 2003, Pages 449-456

  Qin, Yuwen ^a   Chen, Jinlong ^a   Fan, Haibo ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Electronic speckle; Filtering; Fringe; Gray; Image; Interferometry; Pixel; Recursion

Indexed keywords

ALGORITHMS; DEFECTS; INTERFEROMETRY; RUBBER; SPECKLE; SPURIOUS SIGNAL NOISE;

FILTERING METHODS;

IMAGE ANALYSIS;

EID: 0037375852     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(02)00027-1     Document Type: Article

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