In situ diffraction studies of the initial growth processes of textured icosahedral quasicrystalline thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 9, 2005, Pages

  Willmott, P R ^a   Schleputz C M ^a   Herger, R ^a   Patterson, B D ^a   Hassdenteufel, K ^b   Steurer, W ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTAL; CRYSTAL STRUCTURE; CRYSTALLIZATION; ENERGY TRANSFER; STRUCTURE ANALYSIS; SYNCHROTRON RADIATION; X RAY; X RAY DIFFRACTION;

EID: 20344377378     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.094203     Document Type: Article

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