In situ studies of magnetron sputtered Al-Cu-Fe-Cr quasicrystalline thin films

Thin Solid Films

Volumn 420-421, Issue , 2002, Pages 295-299

  Widjaja, E J ^a   Marks, L D ^a  

^a Northwestern University   (United States)

Author keywords

In situ studies; Magnetron sputtering; Quasicrystalline thin films; Transmission Electron microscopy (TEM)

Indexed keywords

ALUMINUM COMPOUNDS; FILM GROWTH; GRAIN GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; MAGNETRON SPUTTERING; QUASICRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

HIGH VACUUM ANNEALING;

THIN FILMS;

EID: 0037011455     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00809-X     Document Type: Conference Paper

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