Transversal growth microstructures of quasicrystalline Ti-Zr-Ni films

Journal of Crystal Growth

Volumn 256, Issue 3-4, 2003, Pages 407-415

  Brien, V ^a   Dauscher, A ^b   Weisbecker, P ^a   Ghanbaja, J ^c   Machizaud, F ^a  

^a CNRS   (France)

^b INSTITUT JEAN LAMOUR   (France)

^c UNIVERSITÉ DE LORRAINE   (France)

Author keywords

A1. Crystal morphology; A1. Nanostructures; A1. Transmission electron microscopy; A1. X ray diffraction; A3. Physical vapor deposition processes; B1. Quasicrystal

Indexed keywords

CRYSTALLIZATION; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; NEODYMIUM LASERS; NICKEL; PULSED LASER DEPOSITION; QUASICRYSTALS; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

CRYSTAL MORPHOLOGY;

THIN FILMS;

EID: 0041743848     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(03)01350-2     Document Type: Article

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