In-plane uniaxial anisotropy rotations in (Ga,Mn)As thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 12, 2005, Pages

  Sawicki, M ^a   Wang, K Y ^b   Edmonds, K W ^c   Campion, R P ^b   Staddon, C R ^b   Farley, N R S ^b   Foxon, C T ^b   Papis, E ^c   Kaminska E ^c   Piotrowska, A ^c   Dietl, T ^a,d   Gallagher, B L ^b  

^a INSTITUTE OF PHYSICS   (Poland)

^b UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^c Department of Micro and Nanotechnology of Wide Bandgap Semiconductors   (Poland)

^d UNIVERSITY OF WARSAW   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM; MANGANESE DERIVATIVE;

ANISOTROPY; ARTICLE; CONCENTRATION (PARAMETERS); CRYSTALLOGRAPHY; DENSITY; FILM; MAGNETISM; QUANTUM CHEMISTRY; SUPERCONDUCTOR; TEMPERATURE; THEORETICAL MODEL;

EID: 20044374858     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.121302     Document Type: Article

References (23)

1. H. Ohno, F. Matsukura, and Y. Ohno, JSAP International, No. 5, 2002, pp. 4-13 (unpublishedd);
2. S. A. Wolf, D. D. Awschalom, R. A. Buhrman, J. M. Daughton, S. Von Molnar, M. L. Roukes, A. Y. Chtchelkanova, and D. M. Treger, Science 294, 1488 (2001);
3. T. Dietl, Acta Phys. Pol. A 100, 139 (2001).
4. H. Munekata, A. Zaslavsky, P. Fumagalli, and R. J. Gambino, Appl. Phys. Lett. 63, 2929 (1993).
5. A. Shen, H. Ohno, F. Matsukura, Y. Sugawara, N. Akiba, T. Kuroiwa, A. Oiwa, A. Endo, S. Katsumoto, and Y. Iye, J. Cryst. Growth 175/176, 1069 (1997).
6. X. Liu, Y. Sasaki, and J. K. Furdyna, Phys. Rev. B 67, 205204 (2003).
7. T. Dietl, H. Ohno, F. Matsukura, F. Cibert, and D. Ferrand, Science 287, 1019 (2000).
8. T. Dietl, H. Ohno, and F. Matsukura, Phys. Rev. B 63, 195205 (2001).
9. M. Abolfath, T. Jungwirth, J. Brum, and A. H. MacDonald, Phys. Rev. B 63, 054418 (2001).
10. M. Sawicki, F. Matsukura, A. Idziaszek, T. Dietl, G. M. Schott, C. Ruester, C. Gould, G. Karczewski, G. Schmidt, and L. W. Molenkamp, Phys. Rev. B 70, 245325 (2004).
11. H. X. Tang, R. K. Kawakami, D. D. Awschalom, and M. L. Roukes, Phys. Rev. Lett. 90, 107201 (2003).
12. D. Hrabovsky, E. Vanelle, A. R. Fert, D. S. Yee, and J. P. Redoules, Appl. Phys. Lett. 81, 2806 (2002).
13. U. Welp, V. K. Vlasko-Vlasov, X. Liu, J. K. Furdyna, and T. Wojtowicz, Phys. Rev. Lett. 90, 167206 (2003).
14. M. Tanaka and Y. Higo, Phys. Rev. Lett. 87, 026602 (2001).
15. R. P. Campion, K. W. Edmonds, L. X. Zhao, K. Y. Wang, C. T. Foxon, B. L. Gallagher, and C. R. Staddon, J. Cryst. Growth 247, 42 (2003).
16. P. W. Fewster, X-Ray Scattering From Semiconductors (Imperial College Press, London, 2000), p. 170.
17. K. W. Edmonds, R. P. Campion, K. Y. Wang, A. C. Neumann, B. L. Gallagher, C. T. Foxon, and P. C. Main, J. Appl. Phys. 93, 6787 (2003).
18. K. Y. Wang, K. W. Edmonds, R. P. Campion, B. L. Gallagher, N. R. L. Farley, C. T. Foxon, M. Sawicki, P. Boguslawski, and T. Dietl, J. Appl. Phys. 95, 6512 (2004).
19. K. Y. Wang, M. Sawicki, K. W. Edmonds, R. P. Campion, B. L. Gallagher, C. T. Foxon, and T. Dietl (unpublished).
20. K. W. Edmonds, K. Y. Wang, R. P. Campion, A. C. Neumann, N. R. S. Farley, B. L. Gallagher, and C. T. Foxon, Appl. Phys. Lett. 81, 4991 (2002).
21. K. W. Edmonds, P. Boguslawski, K. Y. Wang, R. P. Campion, S. N. Novikov, N. R. S. Farley, B. L. Gallagher, C. T. Foxon, M. Sawicki, T. Dietl, M. B. Nardelli, and J. Bernholc, Phys. Rev. Lett. 92, 037201 (2004).
22. U. Welp, V. K. Vlasko-Vlasov, X. Liu, J. K. Furdyna, and T. Wojtowicz, Appl. Phys. Lett. 85, 260 (2004).
23. I. Vurgaftman, J. R. Meyer, L. R. Ram-Mohan, J. Appl. Phys. 89, 5815 (2001).