Investigation of millisecond-long analog single-event transients in the LM6144 op amp

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 II, 2004, Pages 3529-3536

  Boulghassoul, Y ^a   Buchner, S ^b   McMorrow, Dale ^c   Pouget, V ^d   Massengill, L W ^a   Fouillat, P ^d   Holman, W T ^a   Poivey, C ^b   Howard, J W ^b   Savage, M ^e   Maher, M C ^f  

^a VANDERBILT UNIVERSITY   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

^c NAVAL RESEARCH LABORATORY   (United States)

^d UNIVERSITÉ BORDEAUX 1   (France)

^e NAVSEA   (United States)

^f NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

Analog single event transients; Heavy ion broad beam; LM6144 operational amplifier; Millisecond pulse width; Multistable circuit; Picosecond pulsed lased; Radiation hardening by design

Indexed keywords

ELECTRIC NETWORK ANALYSIS; HEAVY IONS; INTEGRATED CIRCUITS; IONIZATION; IONS; LASERS; VOLTAGE MEASUREMENT;

ANALOG SINGLE-EVENT TRANSIENTS; HEAVY-ION BROADBEAM; LM6144 OPERATIONAL AMPLIFIER; MILLISECOND PULSE WIDTH; MULTISTABLE CIRCUIT; PICOSECOND PULSED LASED; RADIATION HARDENING BY DESIGN;

TRANSIENTS;

EID: 19944380750     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839196     Document Type: Conference Paper

References (11)

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