Validation of radiation hardened designs by pulsed laser testing and SPICE analysis

Microelectronics Reliability

Volumn 39, Issue 6-7, 1999, Pages 931-935

  Pouget, V ^a   Lewis, D ^a   Lapuyade, H ^a   Briand, R ^a   Fouillat, P ^a   Sarger, L ^b   Calvet, M C ^c  

^a UNIVERSITÉ BORDEAUX 1   (France)

^b UMR 5798   (France)

^c AEROSPATIALE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COMPUTER SIMULATION; PULSED LASER APPLICATIONS; RADIATION HARDENING;

RADIATION INDUCED TRANSIENT CURRENT; SPICE ANALYSIS;

INTEGRATED CIRCUIT TESTING;

EID: 0033147338     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(99)00125-0     Document Type: Article

References (6)

1. J. S. Melinger, D. McMorrow, A. B. Campbell, S. Buchner, L. H. Tran, A. R. Knudson, W. R. Curtice, "Pulsed laser-induced single event upset and charge collection measurements as a function of optical penetration depth", J. Appl. Phys., vol. 84, no. 2, pp. 690-703, 1998.
2. A. Y. Nikiforov, O. B. Mavritsky, A. N. Egorov, V. S. Figurov, V. A. Telets, P. K. Skorobogatov, S. A. Polevitch, "RADON 5-E Portable Pulsed Laser Simulator: Description, Qualification Technique and Results, Dosimetry Procedure", IEEE Radiation Effects Workshop Records, pp. 49-54, 1996.
3. th IEEE International On-Line Testing Workshop, Capri (Italy), 6-8 July 1998.
4. V. Pouget, H. Lapuyade, D. Lewis, Y. Deval, P. Fouillat, L. Sarger, "SPICE Modeling of the Transient Response of Irradiated MOSFETs", Proc. of RADECS 99, Fontevraud (France), 13-17 September 1999.
5. th IEEE International On-Line Testing Workshop, Rhodes (Greece), 5-7 July 1999.
6. R. Briand, Y. Deval, P. Fouillat, A. Touboul, R. Gaillard, M.-C. Calvet, P. Calvel, "Modeling the Substrate Junction Photocurrent in Junction Isolated Commercial Circuits", Proc. of RADECS 98, Oxford (United Kingdom), September 1998.