Towards a single event transient hardness assurance methodology

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn 1, Issue 2, 2002, Pages 343-350

  Marec, Ronan ^a   Chatry, Christian ^b   Adell, Philippe ^c   Mion, Olivier ^a   Barillot, Catherine ^a   Calvel, Philippe ^a   Cresciucci, Laetitia ^a  

^a THALES ALENIA SPACE   (France)

^b TRAD Tests and Radiations   (France)

^c VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CLOSED LOOP CONTROL SYSTEMS; HEAVY IONS; INTEGRATED CIRCUIT LAYOUT;

HARDNESS ASSURANCE METHODOLOGY; SINGLE EVENT TRANSIENT SUSCEPTIBILITY;

INTEGRATED CIRCUIT TESTING;

EID: 0036995137     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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2. R. Koga, S.D. Pinkerton, S. C. Moss, S. LaLumondiere, S. J. Hansel, K. B Crawford, and W. R. Crain, "Observation of Single Event Upsets in Analog Microcircuits," Vol 40, pp.1838-1844, 1993.
3. D. Pinkerton, S.D. LaLumondiere, and M.C. Maher, "Single Event Upset (SEU) Sensitivity Dependence of Linear Integrated Circuits (ICs) on Bias Conditions," IEEE Trans. Nucl. Sci., vol. 44., pp. 2325-2332, 1997.
4. P. Adell, R. D. Schrimpf, H. Barnaby, R. Marec, N. Chatry, P. Calvel, C. Barillot, and O. Mion, "Analysis of Single Event Transients in Analog Integrated Circuits", IEEE Trans. Nucl. Sci., Vol 43, pp 2616-2623, Dec 2000.
5. A. H. Johnston, G. M. Swift, T. F. Miyahira and L. D. Edmonds, "A model for Single-Event Transients in Comparators", IEEE Trans. Nucl. Sci., Vol 47, pp 2624-2633, Dec 2000.
6. P. Calvet, C. Barillot, and P. Lamothe, "An empirical Model for Predicting Proton Induced Upset", IEEE Trans. Nucl. Sci., Vol 43, pp 2827-2832, Dec 96.