Characterization of SET response of the LM124A the LM111, and the LM6144

IEEE Radiation Effects Data Workshop

Volumn 2003-January, Issue , 2003, Pages 121-126

  Savage, M W ^a   Turflinger, T ^a   Titus, J L ^a   Pease, R L ^b   Poivey, C ^c  

^a Naval Surface Warfare Center Crane   (United States)

^b RLP Research Inc   (United States)

^c NASA HEADQUARTERS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAVY IONS; RADIATION HARDENING; TESTING; TRANSIENTS;

ION ENVIRONMENT; SINGLE EVENT TRANSIENTS; TEST METHOD;

RADIATION EFFECTS;

EID: 11044236042     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2003.1281361     Document Type: Conference Paper

References (6)

1. M. W. Savage, T. Turflinger, J. L. Titus, H.F. Barsun, Y. Boulghassoul, L. W. Massengill, A. Sternberg, R. L. Pease, "Variations in SET Pulse Shapes in the LM124A and LM111," IEEE Radiation Effects Data Workshop, 2002, pp. 75-81.
2. P. Adell, R.D. Schrimpf, H.J. Barnaby, R. Marec, C. Chatry, P. Calvel, C. Barillot, O. Mion, "Analysis of Single-Event Transients in Analog Circuits," IEEE Trans. Nucl. Sci., Vol. NS-47 No. 9, pp. 2616-2623, Dec. 2000.
3. T. Turflinger, "Single-event effects in analog and mixed-signal integrated circuits," IEEE Trans. Nucl. Sci., Vol. NS-43, pp. 594-602, Apr. 1996.
4. R. Koga, S.D. Pinkerton, S.C. Moss, D.C. Mayer, S. LaLumondiere, S.J. Hansel, K.B. Crawford, W.R. Crain, "Observation of Single Event Upsets in Analog Microcircuits," IEEE Trans. Nucl. Sci., Vol. NS-40, pp. 1838-1844, Dec. 1993.
5. th Annual AAS Guidance Control Conference, AAS 93-044-1 Keystone, CO, Feb. 1993.
6. R. Eccofet, S. Duzellier, P. Tastet, C. Aicardi, and M. Labrunee, "Observation of single event upsets in analog microcircuits," IEEE Radiation Effects Data Workshop, 1994, pp. 72-77.