Measurement of the free-energy dependence of interfacial charge-transfer rate constants using ZnO/H2O semiconductor/liquid contacts

Journal of the American Chemical Society

Volumn 127, Issue 21, 2005, Pages 7815-7824

  Hamann, Thomas W ^a   Gstrein, Florian ^a   Brunschwig, Bruce S ^a   Lewis, Nathan S ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CHARGE TRANSFER; CURRENT DENSITY; ELECTRODES; INTERFACES (MATERIALS); RATE CONSTANTS; REDOX REACTIONS; SURFACE CHEMISTRY;

DIFFERENTIAL CAPACITANCE; ELECTRON TRANSFER; INTERFACIAL CHARGE TRANSFER; LIQUID CONTACTS; REDOX COUPLES;

FREE ENERGY;

WATER; ZINC OXIDE;

AQUEOUS SOLUTION; ARTICLE; CHEMICAL STRUCTURE; ELECTRIC CAPACITANCE; ELECTRICITY; ELECTROCHEMISTRY; ELECTRODE; ELECTROSPRAY MASS SPECTROMETRY; ENERGY TRANSFER; IONIC STRENGTH; MATHEMATICAL MODEL; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; OXIDATION REDUCTION POTENTIAL; REACTION TIME; SEMICONDUCTOR; STEADY STATE; THERMODYNAMICS;

EID: 19744376228     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja0436188     Document Type: Article

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