Free-energy dependence of electron-transfer rate constants at Si/liquid interfaces

Journal of Physical Chemistry B

Volumn 101, Issue 51, 1997, Pages 11136-11151

  Fajardo, Arnel M ^a   Lewis, Nathan S ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CHARGE CARRIERS; CURRENT DENSITY; ELECTROCHEMICAL ELECTRODES; ELECTROLYTES; ELECTRONIC DENSITY OF STATES; FERMI LEVEL; FREE ENERGY; INTERFACIAL ENERGY; PHASE INTERFACES; REACTION KINETICS; SEMICONDUCTING SILICON;

SEMICONDUCTING ELECTRODES;

CHARGE TRANSFER;

EID: 0031360722     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp972087p     Document Type: Article

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