Sulphide centres on (111) AgBr surfaces: Effect of tetraazaindene on electronic properties

Imaging Science Journal

Volumn 52, Issue 1, 2004, Pages 27-34

  Hailstone, R K ^a   DiFrancesco, A G ^a   Tyne, M ^a   De Keyzer, R ^b  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

^b AGFA GEVAERT N V   (Belgium)

Author keywords

Chemical sensitization; Chemical sensitization mechanism; Sulphur sensitization; Tetraazaindene

Indexed keywords

CHEMICAL SENSITIZATION; CHEMICAL SENSITIZATION MECHANISM; SULPHUR SENSITIZATION; TETRAAZAINDENE;

ACTIVATION ENERGY; BANDWIDTH; COATINGS; COMPUTER SIMULATION; ELECTRON TRAPS; ELECTRONIC PROPERTIES; EMULSIONS; EXTRUSION; GROUND STATE; LIGHT ABSORPTION; PHOTOGRAPHIC ACCESSORIES; SENSITOMETERS; SULFUR; VACUUM;

SILVER COMPOUNDS;

EID: 1942508180     PISSN: 13682199     EISSN: None     Source Type: Journal    
DOI: 10.1179/136821904225011555     Document Type: Article

References (20)

1. Anonymous. Research Disclousre, September 1994, pp. 510-511.
2. Hailstone, R. K., Zhao, T., DiFrancesco, A. G. and Tyne, M. J. Imag. Sci. Technol., 2001, 45, 76.
3. Hailstone, R. K., French, J. and De Keyzer, R. Imag. Sci. J., 2003, 51, 125.
4. DiFrancesco, A. G., Tyne, M., Pryor, C. and Hailstone, R. K. J Imag. Sci. Technol., 1996, 40, 576.
5. Charlier, E., Van Doorselaer, M. K., Gijbels, R., De Keyzer, R. and Geuens, I. J. Imag. Sci. Technol., 2000, 44, 235.
6. Kellogg, L. M. International Symposium on Silver Halide Technology, Victoria, BC, 1997, p. 150. IS&T - The Society for Imaging Science and Technology, Springfield, VA, USA.
7. Hailstone, R. K. Photogr. Sci. Eng., 1983, 27, 152.
8. Zhang, D. and Hailstone, R. K. J. Imag. Sci. Technol. 1993, 37, 61.
9. Hailstone, R. K. J. Photogr. Sci. 1984, 32, 25.
10. Hailstone, R. K., French, J. and De Keyzer, R. Imag. Sci. J., 2003, 51, 21.
11. Hailstone, R. K., French, J. and De Keyzer, R. Imag. Sci. J., 2003, 51, 33.
12. Hailstone, R. K., French, J. and De Keyzer, R. Imag. Sci. J., 2003, 51, 141.
13. Hamilton, J. F. Photogr Sci. Eng. 1982, 26, 263.
14. Hailstone, R. K., Liebert, N. B. and Levy, M. J. Imag. Sci., 1990, 45, 169.
15. Hamilton, J. F., Harbison, J. M. and Jeanmaire, D. L. J. Imag. Sci. 1988, 32, 17.
16. Morimura, K. and Mifune, H. J. Soc. Photogr. Sci. Technol. Jpn 1998, 61, 175.
17. Eachus, R. S., Marchetti, A. P., and Muenter, A. A. Annu. Rev. Phys. Chem. 1999, 50, 117.
18. Keevert, J. E. and Gokhale, V. J. Imag. Sci. 1987, 31, 243.
19. Takiguchi, H. J. Imag. Sci. 1988, 32, 20.
20. Cash, D. J. J. Photogr. Sci. 1981, 29, 133.