Sulphide centres on (111) AgBr surfaces: Energy levels and computer simulated sensitometry

Imaging Science Journal

Volumn 51, Issue 3, 2003, Pages 125-139

  Hailstone, R K ^a   French, J ^a   De Keyzer, R ^b  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

^b AGFA GEVAERT N V   (Belgium)

Author keywords

Chemical sensitization; Chemical sensitization mechanisms; Computer simulated sensitometry; Diffuse reflection spectroscopy; Long wavelength sensitivity; Sulphur sensitization

Indexed keywords

ABSORPTION; ACTIVATION ENERGY; COMPUTER SIMULATION; ELECTRON ENERGY LEVELS; ELECTRON TRAPS; PHOTOGRAPHY; SENSITOMETERS; SILVER COMPOUNDS; SPECTROSCOPIC ANALYSIS; SURFACES;

CHEMICAL SENSITIZATION;

IMAGING SYSTEMS;

EID: 0141904050     PISSN: 13682199     EISSN: None     Source Type: Journal    
DOI: 10.1080/13682199.2003.11784419     Document Type: Article

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