Sulphide centres on (111) AgBr surfaces: The effect of thiocyanate on electronic properties

Imaging Science Journal

Volumn 51, Issue 3, 2003, Pages 141-149

  Hailstone, R K ^a   French, J ^a   Tan, J ^a   De Keyzer, R ^b  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

^b AGFA GEVAERT N V   (Belgium)

Author keywords

Chemical sensitization; Chemical sensitization mechanism; Computer simulation; Sulphur sensitization; Thiocyanate

Indexed keywords

ACTIVATION ENERGY; COMPUTER SIMULATION; ELECTRONIC PROPERTIES; SENSITOMETERS; SILVER COMPOUNDS; SULFUR COMPOUNDS; SURFACES;

CHEMICAL SENSITIZATION;

IMAGING SYSTEMS;

EID: 0142007864     PISSN: 13682199     EISSN: None     Source Type: Journal    
DOI: 10.1080/13682199.2003.11784420     Document Type: Article

References (28)

1. Damschroder, US Pat. 2,642,361.
2. Van Doorselaer, M. K. In Proceedings of the Second International East-West Symposium on The Factors Influencing the Efficiency of Photographic Imaging, Kona, Hawaii, 30 October-4 November 1988, paper F17.
3. Charlier, E., Gijbels, R., Van Doorselaer, M. K. and De Keyzer, R. In Proceedings of the International Symposium on Silver Halide Technology, Montreal, Canada, 2000, p. 172.
4. Spirina, J.,Kagakin, E., Shichullina, S. and Nikonova, G. In IS&T 48th Annual Conference, Washington, DC, 1995, p. 279.
5. Hailstone, R. K., Zhao, T., DiFrancesco, A. G. and Tyne, M. J. Imaging Sci. Technol., 2001, 45, 76.
6. DiFrancesco, A. G., Tyne, M., Pryor, C. and Hailstone, R. K. J. Imaging Sci. Technol., 1996, 40, 576.
7. Hailstone, R. K. Photogr. Sci. Engng, 1983, 27, 152.
8. Zhang, D. and Hailstone, R. K. J. Imaging Sci. Technol., 1993, 37, 61.
9. Hailstone, R. K. J. Photogr. Sci., 1984, 32, 25.
10. Hamilton, J. F. In The Theory of the Photographic Process (Ed. T. H. James), 1977, p. 138 (Macmillan, New York).
11. Charlier, E., Van Doorselaer, M. K., Gijbels, R., De Keyzer, R. and Geuens, I. J. Imaging Sci Technol., 2000, 44, 235.
12. Hailstone, R. K., French, J. and De Keyzer, R. Imaging Sci. J., 2003, 51(1), 21-32.
13. Hailstone, R. K., French, J. and De Keyzer, R. Imaging Sci. J., 2003, 51(1), 33-45.
14. Hailstone, R. K., French, J. and De Keyzer, R. Imaging Sci. J., 2003 (accepted).
15. Hamilton, J. F. Photogr. Sci. Engng, 1982, 26, 263.
16. Hailstone, R. K., Liebert, N. B. and Levy, M. J. Imaging Sci., 1990, 45, 169.
17. Hamilton, J. F., Harbison, J. M. and Jeanmaire, D. L. J. Imaging Sci., 1988, 32, 17.
18. Morimura, K. and Mifune, H. J. Soc. Photogr. Sci. Technol. Japan, 1998, 61, 175.
19. Eachus, R. S., Marchetti, A. P. and Muenter, A. A. Ann. Rev. Phys. Chem., 1999, 50, 117.
20. Hailstone, R. K. Computers in Physics, 1994, 8, 205.
21. Hailstone, R. K. J. Phys. Chem., 1995, 99, 4414.
22. Hailstone, R. K. J. Imaging Sci. Technol., 1995, 39, 407.
23. Hailstone, R. K. and De Keyzer, R. J. Imaging Sci. Technol., 2001, 45, 338.
24. Hailstone, R. K. and De Keyzer, R. J. Phys. Chem. B, 2001, 105, 7533.
25. Hailstone, R. K. Imaging Sci. J., 2001, 49, 189.
26. Tani, T. J. Imaging Sci., 1985, 29, 93.
27. Tani, T. J. Imaging Sci., 1986, 30, 41.
28. Hailstone, R. K., Liebert, N. B., Levy, M. and Hamilton, J. F. J. Imaging Sci., 1991, 35, 219.