Sulphide centres on AgIBr (100) surfaces: Characterization and energy levels

Imaging Science Journal

Volumn 51, Issue 1, 2003, Pages 21-32

  Hailstone, R K ^a   French, J ^a   De Keyzer, R ^b  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

^b AGFA GEVAERT N V   (Belgium)

Author keywords

Chemical sensitization; Chemical sensitization mechanisms; Diffuse reflection spectroscopy; Long wavelength sensitivity; Sulphur sensitization

Indexed keywords

ACTIVATION ENERGY; ELECTRON ENERGY LEVELS; LIGHT ABSORPTION; PHOTONS; SENSITIVITY ANALYSIS; SILVER COMPOUNDS; SURFACES;

CHEMICAL SENSITIZATION;

SULFUR;

EID: 0037242439     PISSN: 13682199     EISSN: None     Source Type: Journal    
DOI: 10.1080/13682199.2003.11784411     Document Type: Article

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