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Volumn 45, Issue 1, 2001, Pages 76-82
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Sulfide centers on (111) AgBr surfaces: Characterization
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
PHOTOGRAPHIC EMULSIONS;
SEMICONDUCTING SILVER COMPOUNDS;
SPECTROSCOPIC ANALYSIS;
SULFUR;
DIFFUSE REFLECTANCE SPECTROSCOPY;
SULFUR SENSITIZATION;
WAVELENGTH SENSITIVITY MEASUREMENTS;
SENSITOMETERS;
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EID: 0035081490
PISSN: 10623701
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (14)
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References (42)
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