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Volumn 45, Issue 1, 2001, Pages 76-82

Sulfide centers on (111) AgBr surfaces: Characterization

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; PHOTOGRAPHIC EMULSIONS; SEMICONDUCTING SILVER COMPOUNDS; SPECTROSCOPIC ANALYSIS; SULFUR;

EID: 0035081490     PISSN: 10623701     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (14)

References (42)
  • 7
    • 0342425796 scopus 로고    scopus 로고
    • Preprints of the International Congress of Imaging Science, Antwerp, Belgium
    • M. K. Van Doorselaer and E. Charlier, Preprints of the International Congress of Imaging Science, Antwerp, Belgium, 1998, p. 267.
    • (1998) , pp. 267
    • Van Doorselaer, M.K.1    Charlier, E.2
  • 10
  • 27
    • 0000008434 scopus 로고
    • D. Volman, G. Hammond, and D. Neckers, Eds., John Wiley and Sons, New York
    • A. P. Marchetti and R. S. Eachus, in Advances in Photochemistry 17, D. Volman, G. Hammond, and D. Neckers, Eds., John Wiley and Sons, New York, 1992, p. 145.
    • (1992) Advances in Photochemistry , vol.17 , pp. 145
    • Marchetti, A.P.1    Eachus, R.S.2
  • 35
    • 0342860388 scopus 로고    scopus 로고
    • note
    • Computer simulation studies of temporary hole traps that do not act as recombination centers show an overall increase in the efficiency of latent-image formation. However, the effect is much greater for low-irradiance than high-irradiance exposures.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.