Property of carbon nanotube tip for surface topography characterization

Applied Surface Science

Volumn 228, Issue 1-4, 2004, Pages 53-56

  Guo, Liqiu ^a   Liang, Ji ^a   Dong, Shen ^b   Xu, Zongwei ^b   Zhao, Qingliang ^b  

^a TSINGHUA UNIVERSITY   (China)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Atomic force microscopy; Carbon nanotube; Surface characterization; Tip

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; DEGRADATION; DEPOSITION; MATHEMATICAL MODELS; SCANNING; SCANNING ELECTRON MICROSCOPY; SILICON; SURFACE CHEMISTRY; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY;

CAPILLARY FORCES; ELECTROSTATIC ATTRACTION; SURFACE CHARACTERIZATION; TIPS;

CARBON NANOTUBES;

EID: 1942453340     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2003.12.032     Document Type: Article

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