Optical system for double-biprism electron holography

Journal of Electron Microscopy

Volumn 54, Issue 1, 2005, Pages 19-27

  Harada, Ken ^a,b   Akashi, Tetsuya ^b   Togawa, Yoshihiko ^a   Matsuda, Tsuyoshi ^a,b   Tonomura, Akira ^a,b  

^a Japan Science and Technology Agency   (Japan)

^b HITACHI LTD   (Japan)

Author keywords

Electron biprism; Electron holography; Electron microscopy; Electron optics; Reconstruction

Indexed keywords

ELECTRON MICROSCOPY; ELECTRONS; HOLOGRAMS; HOLOGRAPHIC INTERFEROMETRY; OPTICAL SYSTEMS;

BIPRISM; ELECTRON BIPRISM; ELECTRON INTERFEROMETRY; FRINGE SPACING; IMAGE PLANE; INTERFEROGRAMS; INTERFEROMETRY AND HOLOGRAPHIES; MAGNIFYING LENS; OBJECTIVE LENS; RECONSTRUCTION;

ELECTRON HOLOGRAPHY;

EID: 19044379806     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/dfh098     Document Type: Article

References (16)

1. Tonomura A (1999) Electron Holography, 2nd edn. (Springer, Heidelberg).
2. Missiroli G F, Pozzi G, and Valdrè U (1981) Electron interferometry and interference electron microscopy. J. Phys. E. Sci. Instrum. 14: 649-671.
3. Möllenstedt G and Dücker D (1955) Fresnelscher Interferenzversuch mit einem Biprisma für Elektronenwellen. Naturwissenschaften 42: 41.
4. Akashi T, Harada K, Matsuda T, Kasai H, Tonomura A, Furutsu T, Moriya N, Yoshida T, Kawasaki T, Kitazawa K, and Koinuma H (2002) Record number (11 000) of interference fringes obtained by a 1 MV field-emission electron microscope. Appl. Phys. Lett. 81: 1922-1924.
5. Kawasaki T, Yoshida T, Matsuda T, Osakabe N, Tonomura A, Matsui I, and Kitazawa K (2000) Fine crystal lattice fringes observed using a transmission electron microscope with 1 MeV coherent electron waves. Appl. Phys. Lett. 76: 1342-1344.
6. Lehmann M and Lichte H (2002) Tutorial on off-axis electron holography. Micros. Microanal. 8: 447-466.
7. Lichte H (1986) Electron holography approaching atomic resolution. Ultramicroscopy 20: 293-304.
8. 5. Jpn. J. Appl. Phys. 30: L1830-L1833.
9. Tonomura A, Matsuda T, Tanabe H, Osakabe N, Endo J, Fukuhara A, Shinagawa K, and Fujiwara H (1982) Electron holography technique for investigating thin ferromagnetic films. Phys. Rev. B 25: 6799-6804.
10. Bonevich J E, Harada K, Matsuda T, Kasai H, Yoshida T, Pozzi G, and Tonomura A (1993) Electron holography observation of vortex lattices in a superconductor. Phys. Rev. Lett. 70: 2952-2955.
11. Harada K, Tonomura A, Togawa Y, Akashi T, and Matsuda T (2004) Double-biprism electron interferometry. Appl. Phys. Lett. 84: 3229-3231.
12. Harada K, Tonomura A, Matsuda T, Akashi T, and Togawa Y (2004) High-resolution observation by double-biprism electron holography. J. Appl. Phys. 96: 6097-6102.
13. Harada K, Endoh H, and Shimizu R (1988) Anti-contamination electron biprism for electron holography. J. Electron Microsc. 37: 199-201.
14. Matteucci G, Missiroli G F, Chen J W, and Pozzi G (1988) Mapping of microelectric fields with double-exposure electron holography. Appl. Phys. Lett. 52: 176-178.
15. Endo J, Chen J, Kobayashi D, Wada Y, and Fujita H (2002) Transmission laser microscope using the phase-shifting technique and its application to measurement of optical waveguides. Appl. Opt. 41: 1308-1312.
16. Lichte H, Geiger D, Harscher A, Heindl E, Lehmann M, Malamidis D, Orchowski A, and Rau WD (1996) Artefacts in electron holography. Ultramicroscopy 64: 67-77.