Transmission laser microscope using the phase–shifting technique and its application to measurement of optical waveguides

Applied Optics

Volumn 41, Issue 7, 2002, Pages 1308-1314

  Endo, Junji ^a,b   Chen, Jun ^a,c   Kobayashi, Dai ^a,d   Wada, Yasuo ^a,b   Fujita, Hiroyuki ^a,e  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b HITACHI LTD   (Japan)

^c TOKYO POLYTECHNIC UNIVERSITY   (Japan)

^d TOKYO DENKI UNIVERSITY   (Japan)

^e INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

LASER OPTICS; LENSES; OPTICAL BEAM SPLITTERS; OPTICAL WAVEGUIDES; PHASE SHIFT; REFRACTIVE INDEX; TRANSMISSION ELECTRON MICROSCOPY;

TRANSMISSION LASER MICROSCOPE;

MICROSCOPES;

EID: 0036507895     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.001308     Document Type: Article

References (6)

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