High-resolution observation by double-biprism electron holography

Journal of Applied Physics

Volumn 96, Issue 11, 2004, Pages 6097-6102

  Harada, Ken ^a,b,c,d   Tonomura, Akira ^a,b,c,d   Matsuda, Tsuyoshi ^a,c,d   Akashi, Tetsuya ^a,d   Togawa, Yoshihiko ^d  

^a HITACHI LTD   (Japan)

^b Advanced Research Laboratory   (Japan)

^c Naka Division   (Japan)

^d INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRODES; ELECTRON MICROSCOPES; HOLOGRAMS; INTERFEROMETERS; PRISMS; SPECTRUM ANALYSIS; THIN FILMS;

BIPRISM INTERFEROMETER; CARRIER FRINGES; FILAMENT ELECTRODES; RECONSTRUCTION PROCESSES;

ELECTRON HOLOGRAPHY;

EID: 19044400233     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1803105     Document Type: Article

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