Microstructure of sputter deposited TiO2/SiO2 multilayer optical coatings

Materials Research Society Symposium - Proceedings

Volumn 654, Issue , 2001, Pages

  Sutter, E ^a   Sutter, P ^a   Moore, J J ^a  

^a Department of Metallurgical and Materials Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL MICROSTRUCTURE; DENSITY (SPECIFIC GRAVITY); OPTICAL COATINGS; OPTICAL FILTERS; OPTICAL MULTILAYERS; OPTICAL PROPERTIES; SILICA; SPUTTER DEPOSITION; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY;

CROSS SECTION TRANSMISSION ELECTRON MICROSCOPY; MULTILAYER OPTICAL COATINGS;

TITANIUM DIOXIDE;

EID: 18744437080     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)