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Thin Solid Films

Volumn 349, Issue 1, 1999, Pages 212-219

Ellipsometric characterization and influence of relative humidity on TiO2 layers optical properties

(4) Alvarez Herrero, A a Fort, A J b Guerrero, H a Bernabeu, E c

a INSTITUTO NACIONAL DE TÉCNICA AEROESPACIAL (Spain)

b Taller de Precisión y Centro Electrónico de Artillería (Spain)

c UNIVERSIDAD COMPLUTENSE DE MADRID (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC HUMIDITY; DEPOSITION; ELLIPSOMETRY; EVAPORATION; GLASS; MORPHOLOGY; OPTICAL FILMS; POROUS MATERIALS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TITANIUM DIOXIDE;

COLUMNAR MORPHOLOGY; ELECTRON BEAM REACTIVE EVAPORATION; SPECTROSCOPIC ELLIPSOMETRIC CHARACTERIZATION;

THIN FILMS;

EID: 0032643757 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(99)00145-5 Document Type: Article

Times cited : (44)

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