Atomic scale deformation in the solid surface induced by nanoparticle impacts

Nanotechnology

Volumn 16, Issue 6, 2005, Pages 859-864

  Xu, J ^a   Luo, J B ^a   Lu, X C ^a   Wang, L L ^a   Pan, G S ^a   Wen, S Z ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; NANOSTRUCTURED MATERIALS; POLISHING; SEMICONDUCTOR MATERIALS; SILICON WAFERS; SINGLE CRYSTALS; SOLIDS; SURFACES; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC SCALE DEFORMATION; LATTICE DISTORTION; NANOPARTICLE IMPACTS; SUBSURFACES;

DEFORMATION;

EID: 18744376283     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/6/041     Document Type: Article

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